首页> 外国专利> Workpiece surface's periodic microstructures detection method, involves utilizing transformation illustrating accurately line-shaped periodic microstructure on points of transformation area, on local image signal set

Workpiece surface's periodic microstructures detection method, involves utilizing transformation illustrating accurately line-shaped periodic microstructure on points of transformation area, on local image signal set

机译:工件表面的周期性微观结构检测方法,涉及利用变换来精确显示在变换区域的点,局部图像信号集上的线形周期性微观结构

摘要

The method involves sensing a workpiece surface along a scanning line using a sensor, which supplies electrical output signals assigned to a characteristic of a workpiece surface such that the output signals received along the scanning line are arranged to a local image-signal set. The image-signal set represents a local image of the workpiece surface. A transformation illustrating an accurately line-shaped periodic microstructure on points of a transformation area, is utilized on the local image signal set, so that a transformation image signal set is received. An independent claim is also included for a device for implementing a method for detection of periodic microstructures on a workpiece surface.
机译:该方法包括使用传感器来感测沿着扫描线的工件表面,该传感器提供分配给工件表面的特征的电输出信号,使得沿着扫描线接收的输出信号被布置为局部图像信号集。图像信号集代表工件表面的局部图像。在局部图像信号集上利用示出了在变换区域的点上的精确的线形周期性微结构的变换,从而接收变换图像信号集。还包括用于实现一种用于检测工件表面上的周期性微结构的方法的设备的独立权利要求。

著录项

  • 公开/公告号DE102007008768A1

    专利类型

  • 公开/公告日2008-08-28

    原文格式PDF

  • 申请/专利权人 BREITMEIER MESSTECHNIK GMBH;

    申请/专利号DE20071008768

  • 发明设计人 BREITMEIER ULRICH;

    申请日2007-02-22

  • 分类号G01B21/30;G01B11/30;

  • 国家 DE

  • 入库时间 2022-08-21 19:49:23

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