首页> 外国专利> METHOD OF MANUFACTURING TENSILE-STRAINED GERMANIUM THIN FILM, TENSILE-STRAINED GERMANIUM THIN FILM, AND MULTILAYER FILM STRUCTURE

METHOD OF MANUFACTURING TENSILE-STRAINED GERMANIUM THIN FILM, TENSILE-STRAINED GERMANIUM THIN FILM, AND MULTILAYER FILM STRUCTURE

机译:拉伸拉伸锗薄膜的制造方法,拉伸拉伸锗薄膜的制造以及多层膜结构

摘要

PROBLEM TO BE SOLVED: To provide a multilayer film structure in which relaxation of strain of a germanium tin mixed crystal layer is promoted and a tensile-strained germanium layer with a larger in-plane tensile strain can be formed.;SOLUTION: The method of forming a suitable multilayer film structure 10 on a semiconductor device includes the step of forming a germanium layer 12 over a silicon substrate 11, forming a germanium tin mixed crystal layer 13 over the germanium layer, and forming a tensile-strained germanium layer 14 over the germanium tin mixed crystal layer.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种多层膜结构,其中促进了锗锡混合晶体层的应变的松弛,并且可以形成面内拉伸应变较大的拉伸应变的锗层。在半导体器件上形成合适的多层膜结构10包括以下步骤:在硅衬底11上形成锗层12;在锗层上形成锗锡混合晶体层13;以及在硅层上方形成拉伸应变的锗层14。锗锡混合晶体层。;版权所有:(C)2009,日本特许厅

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