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Until the metal membrane suffering lets flow

机译:直到金属膜受难为止

摘要

PROBLEM TO BE SOLVED: To perform a heat treatment with superior productivity while generation of oxide on the surface of a metal film is restrained.;SOLUTION: A plurality of semiconductor wafers on which the metal films are stuck as electrodes are set in a crystal cassette or the like and put in an oven furnace, and nitrogen gas is made to flow in the furnace at a room temperature. After oxygen concentration in the furnace reaches several ppm which is the concentration of the oxygen contained in the nitrogen gas, hydrogen gas is introduced in the furnace, and oxygen concentration in the atmosphere is made at most 1 ppm. In the state, the temperature of the furnace is increased and held at a prescribed heat treatment temperature, and a heat treatment is performed. When the temperature of the furnace falls down near the room temperature, supply of the hydrogen gas is stopped. After the inside of the furnace is replaced by 100% nitrogen gas, the wafers are taken out.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:为了以高生产率进行热处理,同时抑制金属膜表面上的氧化物的产生。;解决方案:将多个金属膜作为电极粘贴在其上的半导体晶片放置在晶体盒中将其放入烤箱炉中,使氮气在室温下在炉中流动。在炉子中的氧气浓度达到氮气中所含的氧气浓度的几ppm后,将氢气引入炉子中,并使大气中的氧气浓度至多为1ppm。在该状态下,使炉的温度上升并保持在规定的热处理温度,并进行热处理。当炉子的温度下降到接近室温时,停止氢气的供应。用100%的氮气置换炉内之后,取出晶片。版权所有:(C)2004,日本特许厅

著录项

  • 公开/公告号JP4304945B2

    专利类型

  • 公开/公告日2009-07-29

    原文格式PDF

  • 申请/专利号JP20020277932

  • 发明设计人 中嶋 経宏;

    申请日2002-09-24

  • 分类号H01L21/28;H01L21/3205;H01L23/52;H01L21/324;

  • 国家 JP

  • 入库时间 2022-08-21 19:39:46

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