Tri-level test mode terminal in limited terminal environment

摘要

A technique for increasing functionality of terminals of an integrated circuit without increasing the number of terminals of the integrated circuit utilizes at least one tri-level terminal and converter circuit that provides a logic level indicative of a test mode of the integrated circuit in response to a corresponding input level. The technique substantially reduces or eliminates false detections of the test mode and substantially reduces or eliminates falsely enabling other (e.g., functional) mode(s) of the integrated circuit.