首页> 外国专利> Systems for Coarse/Fine Program Verification in Non-Volatile Memory Using Different Reference Levels for Improved Sensing

Systems for Coarse/Fine Program Verification in Non-Volatile Memory Using Different Reference Levels for Improved Sensing

机译:用于非易失性存储器中的粗/精细程序验证的系统,使用不同的参考级别以改善感测

摘要

Coarse/fine programming of non-volatile memory is provided in which memory cells are programmed at a first rate of programming prior to reaching a coarse verify level for their intended state and a second rate of programming after reaching the coarse verify level but before reaching the final verify level for their intended state. Large sub-threshold swing factors associated with smaller memory cells can affect the accuracy of sense operations, particularly when sensing at a fine verify level after sensing at a coarse verify level without pre-charging the bit line between the different sensings. Different reference potentials are utilized when sensing at a coarse verify level and a final verify level. The different between the reference potentials can compensate for any discharge of the bit line during the coarse level sensing.
机译:提供了非易失性存储器的粗略/精细编程,其中在达到其预期状态的粗略验证电平之前,以第一编程速率对存储单元进行编程,而在达到粗略校验级别之后但在达到粗略验证级别之前,以第二编程速率对存储单元进行编程。其预期状态的最终验证级别。与较小的存储单元相关联的较大的亚阈值摆幅因子会影响检测操作的准确性,尤其是在以粗略的验证级别进行检测之后以精细的验证级别进行检测而又不对不同检测之间的位线进行预充电时。在粗略验证级别和最终验证级别进行感测时,会使用不同的参考电位。参考电位之间的差异可以补偿在粗略电平感测期间位线的任何放电。

著录项

  • 公开/公告号US2009010068A1

    专利类型

  • 公开/公告日2009-01-08

    原文格式PDF

  • 申请/专利权人 SHIH-CHUNG LEE;

    申请/专利号US20070773035

  • 发明设计人 SHIH-CHUNG LEE;

    申请日2007-07-03

  • 分类号G11C11/34;G11C16/06;

  • 国家 US

  • 入库时间 2022-08-21 19:30:12

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