首页> 外国专利> CONTROLLING ELECTROMECHANICAL BEHAVIOUR OF STRUCTURES WITHIN A MICROELECTROMECHANICAL SYSTEMS DEVICE

CONTROLLING ELECTROMECHANICAL BEHAVIOUR OF STRUCTURES WITHIN A MICROELECTROMECHANICAL SYSTEMS DEVICE

机译:在微机电系统装置中控制结构的机电行为

摘要

ABSTRACT CONTROLLING ELECTROMECHANICAL BEHAVIOR OF STRUCTURES WITHIN A MICROELECTROMECHANICAL SYSTEMS DEVICE The present invention relates to one embodiment, the invention provides a method for fabricating a microelectromechanical systems device. The method comprises fabricating a first layer comprising a film having a characteristic electromechanical response, and a characteristic optical response, wherein the characteristic optical response is desirable and the characteristic electromechanical response is undesirable; and modifying the characteristic electromechanical response of the first layer by at least reducing charge build up thereon during activation of the microelectromechanical systems device.
机译:微机电系统装置内的结构的抽象控制机电性能本发明涉及一个实施例,本发明提供了一种制造微机电系统装置的方法。该方法包括制造第一层,该第一层包括具有特征性机电响应和特征性光学响应的​​膜,其中,特征性光学响应是合乎需要的,特征性机电响应是不合需要的;通过至少减少在微机电系统装置的激活期间积累在其上的电荷,来改变第一层的特征机电响应。

著录项

  • 公开/公告号IN2009CN01565A

    专利类型

  • 公开/公告日2009-08-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN1565/CHENP/2009

  • 申请日2009-03-19

  • 分类号H01L21/00;

  • 国家 IN

  • 入库时间 2022-08-21 19:26:59

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