首页> 外国专利> Light diffuse reflected unevenness optical detection arrangement for detecting location of scratch on glass pane, has detector detecting diffuse-reflected light, where detector does not detect specular-reflected light

Light diffuse reflected unevenness optical detection arrangement for detecting location of scratch on glass pane, has detector detecting diffuse-reflected light, where detector does not detect specular-reflected light

机译:用于检测玻璃板上划痕位置的光漫反射不均匀光学检测装置,具有用于检测漫反射光的检测器,而检测器不能检测到镜面反射光

摘要

The arrangement (1) has an integrated light beam producing-and scanning device (2) for producing light beams i.e. laser beams (3) and for scanning a surface of a glass pane (4) with the produced light beams. A detector (9) is arranged adjacent to the integrated light beam producing-and scanning device in such a manner that the detector detects light that is diffuse-reflected from the glass plane during illumination with the light beams and does not detect light that is specular-reflected from the glass plane during illumination with the light beams. An independent claim is also included for a method for optical detection of light diffuse reflected unevenness of a glass pane.
机译:装置(1)具有集成的光束产生和扫描装置(2),用于产生光束,即激光束(3),并用产生的光束扫描玻璃板(4)的表面。与集成光束产生和扫描装置相邻地布置检测器(9),使得该检测器检测在用光束照射期间从玻璃平面扩散反射的光,而不检测镜面反射的光。 -在光束照射期间从玻璃平面反射。还包括用于光学检测玻璃板的光漫反射不均匀性的方法的独立权利要求。

著录项

  • 公开/公告号DE102007045323A1

    专利类型

  • 公开/公告日2009-04-09

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE20071045323

  • 发明设计人 FINKENZELLER MICHAEL;WALEWSKI JOACHIM;

    申请日2007-09-21

  • 分类号G01B11/30;G01N21/958;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:36

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