Distance transducer, the manufacturing method of the distance transducer and test card, which contains the distance transducer

摘要

Test card of a semiconductor - test device, comprising:a printed circuit board, on the outside of an electrical signal is applied;a distance transducer with a plurality of test needles which are directly in contact with a test object; and connecting lines, which the printed circuit board with the test needles of the distance transducer connect,the distance transducer comprises: substrate components, on one of its sides, the test needles are mounted; and a linking element, the components of the substrate is combined with one another and in order, with the substrate components in the same plane to form a larger areas - substrate.