首页> 外国专利> APPARATUS FOR MEASURING REFLECTION CHARACTERISTICS, CALIBRATION REFERENCE DEVICE FOR THE SAME, AND APPARATUS FOR MEASURING DEGRADATION OF CALIBRATION REFERENCE PLATE OF REFLECTION CHARACTERISTIC MEASURING APPARATUS

APPARATUS FOR MEASURING REFLECTION CHARACTERISTICS, CALIBRATION REFERENCE DEVICE FOR THE SAME, AND APPARATUS FOR MEASURING DEGRADATION OF CALIBRATION REFERENCE PLATE OF REFLECTION CHARACTERISTIC MEASURING APPARATUS

机译:用于测量反射特性的设备,用于同一测量设备的校准参考装置以及用于测量对反射特性测量设备的校准参考板进行退化的设备

摘要

PROBLEM TO BE SOLVED: To provide a technique for detecting changes in the reflection characteristics of a calibration reference plate used for while calibration of a reflection characteristic measuring apparatus.;SOLUTION: The reflection characteristics measuring apparatus for measuring the reflection characteristics of an object to be measured by irradiating illumination light to the object to be measured includes a first illumination-light-receiving means for measuring the reflection characteristics of the object to be measured and the reflection characteristics of the calibration reference plate and a second illumination-light-receiving means for measuring the optical characteristics of the calibration reference plate.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种用于检测在校准反射特性测量设备的同时使用的校准参考板的反射特性变化的技术。解决方案:该反射特性测量设备用于测量待测物体的反射特性。通过向被测物体照射照明光而进行测量的被测物体包括:第一照明光接收装置,其用于测量被测物体的反射特性和校准基准板的反射特性;以及第二照明光接收装置,其用于测量被测物体的反射特性。测量校准参考板的光学特性。;版权所有:(C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP2010190785A

    专利类型

  • 公开/公告日2010-09-02

    原文格式PDF

  • 申请/专利权人 KONICA MINOLTA SENSING INC;

    申请/专利号JP20090036719

  • 发明设计人 IMURA KENJI;

    申请日2009-02-19

  • 分类号G01N21/27;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:57

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