首页> 外国专利> METHOD OF FORMING INSULATION FILM IN FIELD EFFECT TRANSISTOR USING CARBON NANO MATERIAL AND FIELD EFFECT TRANSISTOR USING CARBON NANO MATERIAL

METHOD OF FORMING INSULATION FILM IN FIELD EFFECT TRANSISTOR USING CARBON NANO MATERIAL AND FIELD EFFECT TRANSISTOR USING CARBON NANO MATERIAL

机译:利用碳纳米材料在场效应晶体管中形成绝缘膜的方法以及利用碳纳米材料在场效应晶体管中形成绝缘膜的方法

摘要

PROBLEM TO BE SOLVED: To provide a method of forming an insulation film in a field effect transistor using a carbon nano material for forming the insulation film on a channel surface constituted of the carbon nano material by relatively low temperature treatment, and the field effect transistor using the carbon nano material having the insulation film formed by the method.;SOLUTION: The insulation film 106 comprising a silicon oxide film is formed on the channel surface by heating a CNT-FET including a source electrode 104, a drain electrode 105 and a carbon nano-tube 103 provided on a Si substrate 101 with a polysilazane solution 106a applied to the channel surface by an electric furnace 200 to cause the polysilazane solution 106a to react with moisture.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种在场效应晶体管中形成绝缘膜的方法,该方法使用碳纳米材料通过相对低温处理在由碳纳米材料构成的沟道表面上形成绝缘膜,以及场效应晶体管使用具有通过该方法形成的绝缘膜的碳纳米材料;解决方案:通过加热包括源电极104,漏电极105和源电极105的CNT-FET,在沟道表面上形成包括氧化硅膜的绝缘膜106。碳纳米管103设置在Si基板101上,并通过电炉200将聚硅氮烷溶液106a施加到通道表面上,以使聚硅氮烷溶液106a与水分反应。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2010192599A

    专利类型

  • 公开/公告日2010-09-02

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20090034061

  • 发明设计人 ABE MASUHIRO;MURATA KATSUYUKI;

    申请日2009-02-17

  • 分类号H01L21/316;H01L29/786;H01L21/336;H01L29/06;G01N27/414;

  • 国家 JP

  • 入库时间 2022-08-21 19:04:42

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