首页> 外国专利> PHASED-ARRAY ANTENNA INSPECTION SYSTEM, PHASED-ARRAY ANTENNA INSPECTING APPARATUS, PHASED-ARRAY ANTENNA INSPECTION METHOD AND PHASED-ARRAY ANTENNA

PHASED-ARRAY ANTENNA INSPECTION SYSTEM, PHASED-ARRAY ANTENNA INSPECTING APPARATUS, PHASED-ARRAY ANTENNA INSPECTION METHOD AND PHASED-ARRAY ANTENNA

机译:相控阵天线检查系统,相控阵天线检查装置,相控阵天线检查方法和相控阵天线

摘要

PROBLEM TO BE SOLVED: To provide a phased array-antenna inspection system, phased-array antenna inspection apparatus and phased-array antenna inspection method for accurately inspecting and correcting the functions of a phased-array antenna, and to provide a phased-array antenna which is accurately function-corrected from inspection results obtained therefrom.;SOLUTION: A transmitting-side antenna element 20a and a receiving-side antenna element 30a, and a transmitting-side antenna element 20b and a receiving-side antenna element 30b are proximately disposed face to face. In a state with the phase of the transmitting-side antenna element 20b fixed, the phase of the transmitting-side antenna element 20a is changed; and reception power is measured and a minimal value is calculated from a result of the measurement, thereby performing function inspection on the phased-array antenna 2. If there is a phase shift, the phase shift is corrected.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种相控阵天线检查系统,相控阵天线检查装置和相控阵天线检查方法,以准确地检查和校正相控阵天线的功能,并提供一种相控阵天线解决方案:将发射侧天线元件20a和接收侧天线元件30a以及发射侧天线元件20b和接收侧天线元件30b紧邻放置面对面。在发送侧天线元件20b的相位固定的状态下,发送侧天线元件20a的相位变化。测量接收功率,并根据测量结果计算出最小值,从而对相控阵天线2进行功能检查。如果存在相移,则对相移进行校正。;版权所有:(C)2010 ,JPO&INPIT

著录项

  • 公开/公告号JP2010124360A

    专利类型

  • 公开/公告日2010-06-03

    原文格式PDF

  • 申请/专利权人 OMRON CORP;

    申请/专利号JP20080297642

  • 发明设计人 KASAI HIROKAZU;

    申请日2008-11-21

  • 分类号H01Q3/36;H01Q21/06;

  • 国家 JP

  • 入库时间 2022-08-21 19:03:50

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