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Single event upset (SEU) testing system and method
Single event upset (SEU) testing system and method
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机译:单事件失败(SEU)测试系统和方法
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摘要
One embodiment of the invention relates to a circuit board for testing upsets caused by charged particles delivered under testing conditions. The circuit board comprises a device under test including an internal memory, a memory control unit to generate test patterns for comparison with data read from stored areas within the internal memory of the device under test, and a memory that is configured to only store error data. Other embodiments are described and claimed.
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