首页> 外国专利> TFT array panel with improved connection to test lines and with the addition of auxiliary test lines commonly connected to each other through respective conductive layers which connect test lines to respective gate or data lines

TFT array panel with improved connection to test lines and with the addition of auxiliary test lines commonly connected to each other through respective conductive layers which connect test lines to respective gate or data lines

机译:TFT阵列面板,具有改进的测试线连接以及附加的辅助测试线,这些辅助测试线通常通过将测试线连接到相应的栅极线或数据线的相应导电层相互连接

摘要

A thin film transistor (TFT) array panel with improved contact between the display signal lines and test lines is presented. The TFT array panel includes: gate lines and data lines intersecting each other, switching elements connected to the gate lines and the data lines, and at least one test line disposed near end portions of the gate lines or the data lines. An insulating layer covers the gate lines, the data lines and the switching elements and has first contact holes exposing the end portions of the gate lines or the data lines and second contact holes exposing the test lines. Auxiliary test lines are formed on the insulating layer and commonly connected to conductive layers, wherein the conductive layers connect at least one test line to the gate lines or the data lines via the first and the second contact holes.
机译:提出了一种在显示信号线和测试线之间具有改善的接触的薄膜晶体管(TFT)阵列面板。该TFT阵列面板包括:彼此交叉的栅极线和数据线;连接至栅极线和数据线的开关元件;以及布置在栅极线或数据线的端部附近的至少一条测试线。绝缘层覆盖栅极线,数据线和开关元件,并且具有暴露出栅极线或数据线的端部的第一接触孔和暴露出测试线的第二接触孔。辅助测试线形成在绝缘层上并共同连接到导电层,其中,导电层通过第一和第二接触孔将至少一条测试线连接到栅极线或数据线。

著录项

  • 公开/公告号US7626670B2

    专利类型

  • 公开/公告日2009-12-01

    原文格式PDF

  • 申请/专利权人 JUNG-WOO PARK;

    申请/专利号US20050268877

  • 发明设计人 JUNG-WOO PARK;

    申请日2005-11-07

  • 分类号G02F1/1345;

  • 国家 US

  • 入库时间 2022-08-21 18:47:53

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