首页> 外国专利> DEVICE AND A METHOD FOR MEASURING THE FINE THERMAL PROPERTY OF A PLATE, CAPABLE OF PRECISELY MEASURING THE TEMPERATURE DISTRIBUTION OF A PLATE SURFACE

DEVICE AND A METHOD FOR MEASURING THE FINE THERMAL PROPERTY OF A PLATE, CAPABLE OF PRECISELY MEASURING THE TEMPERATURE DISTRIBUTION OF A PLATE SURFACE

机译:用于测量板的精细热性能的装置和方法,其能够精确地测量板表面的温度分布

摘要

PURPOSE: A device and a method for measuring the fine thermal property of a plate are provided to measure a precise thermal change by accurately measuring the radiating ratio and the temperature distribution of a surface.;CONSTITUTION: A device for measuring the fine thermal property of a plate comprises a vacuum chamber(10), a first measuring unit(20) and a second measuring unit(30). In the vacuum chamber, a heated plate is installed. The first measuring unit is movably installed on of the plate. The first measuring unit measures the temperature change of the plate. The second measuring unit measures the temperature distribution of a plate surface on the plate. The first measuring unit comprises an Infrared temperature sensor and a driving unit.;COPYRIGHT KIPO 2010
机译:目的:提供一种用于测量板的精细热性能的装置和方法,以通过精确地测量表面的辐射比和温度分布来测量精确的热变化。;构成:一种用于测量板的精细热性能的装置板包括真空室(10),第一测量单元(20)和第二测量单元(30)。在真空室中,安装有加热板。第一测量单元可移动地安装在板上。第一测量单元测量板的温度变化。第二测量单元测量板上的板表面的温度分布。第一个测量单元包括一个红外温度传感器和一个驱动单元。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100071340A

    专利类型

  • 公开/公告日2010-06-29

    原文格式PDF

  • 申请/专利号KR20080130019

  • 发明设计人 JUNG WOO CHUL;

    申请日2008-12-19

  • 分类号G01N25/00;G01N25/18;G01N25/20;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:26

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