REFRACTIVE INDEX PROFILE MEASURING METHOD AND REFRACTIVE INDEX PROFILE MEASURING APPARATUS, CAPABLE OF MEASURING THE INNER REFRACTIVE INDEX PROFILE OF AN OBJECT TO BE MEASURED WITHOUT PRECISE PROCESSING

摘要

PURPOSE: A refractive index profile measuring method and refractive index profile measuring apparatus are provided to easily manufacture complicated shape such as an aspheric surface by using a molding technique for an optical glass of high refractivity and a plastic material.;CONSTITUTION: A refractive index profile measuring method comprises the following steps. An object to be measured is immerged in a first medium including a first refractive index 0.01 lower than the refractive index of the object(S10). A first penetration surface of the object is measured by being incident a reference light(S23). The object is immerged in a second medium including a second refractive index which is 0.01 lower than the refractive index of the object and is different to the first refractive index. A second penetration surface of the object is measured by being incident a reference light(S30). The refraction index profile of the object is obtained according to the measured result of the first penetration surface and the second penetration surface(S50).;COPYRIGHT KIPO 2010