首页> 外国专利> METHOD FOR MEASURING CAPACITANCE USING A TEST PATTERN, CAPABLE OF SIMULTANEOUSLY MEASURING PARALLEL CAPACITANCE AND FRINGING CAPACITANCE

METHOD FOR MEASURING CAPACITANCE USING A TEST PATTERN, CAPABLE OF SIMULTANEOUSLY MEASURING PARALLEL CAPACITANCE AND FRINGING CAPACITANCE

机译:使用测试模式来测量电容的方法,该方法可以同时测量并行电容和边缘电容

摘要

PURPOSE: A method for measuring capacitance using a test pattern is provided to analyze a capacitance value of a parallel metal plate and a capacitance value of the edge of a metal plate.;CONSTITUTION: A method for measuring capacitance using a test pattern is as follows. An overall capacitance value is measured using a test pattern of two or more parallel metal plate structures. The area and circumference of upper metal plates(204,208,212) are measured. A parallel capacitance value is measured based on the measured area. A fringing capacitance value is measured based on the overall capacitance value and the parallel capacitance value.;COPYRIGHT KIPO 2010
机译:目的:提供一种使用测试图案测量电容的方法,以分析平行金属板的电容值和金属板边缘的电容值。;构成:使用测试图案测量电容的方法如下。使用两个或多个平行金属板结构的测试图案测量总电容值。测量上部金属板(204,208,212)的面积和周长。基于测量面积来测量并联电容值。基于总电容值和并联电容值测量边缘电容值。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100077995A

    专利类型

  • 公开/公告日2010-07-08

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20080136096

  • 发明设计人 CHO SUNG GON;JUNG WON YOUNG;

    申请日2008-12-29

  • 分类号G01R27/26;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:20

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