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DEFORMATION MEASURING METHOD AND APPARATUS USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

机译:电子斑点图案干涉测量变形的方法及装置

摘要

electronic speckle pattern interferometry for use in observation of objects dynamic deformation, vibration, distortion, such as a high-precision A method and apparatus for road measurements, when performing a phase unwrapping process of the phase-change curve in the time domain, and to have easier to the extent of automation for the detection of the connection points of the phase in the phase change curve. ; Made in calculating the cosine component of the intensity by subtracting the mean intensity from the intensity in a time domain of each point of the larger pattern image and 32, the Hilbert transform in time domain with respect to the cosine component and perform the process, calculating a sine component of the intensity (33), and the calculated cosine component, obtaining a ratio of the arc tangent of the sine calculated component, and the step 34 of determining the object phase, unwrapped operation and the process performing step (35), comprises a step (36) for outputting a three-dimensional deformation distribution data in a form that can be displayed.
机译:电子散斑图干涉仪,用于观察物体的动态变形,振动,变形,例如高精度。一种用于道路测量的方法和设备,用于在时域中执行相变曲线的相展开过程,以及在相变曲线中检测相连接点的自动化程度更容易。 ;通过从较大图案图像和32的每个点的时域中的强度中减去平均强度来计算强度的余弦分量,在时域中对余弦分量进行希尔伯特变换并执行该过程,计算强度(33)的正弦分量和计算出的余弦分量,获得正弦计算出的分量的反正切之比,以及确定物体相位的步骤34,展开操作和执行步骤(35)的过程,包括步骤(36),用于以可以显示的形式输出三维变形分布数据。

著录项

  • 公开/公告号KR100947015B1

    专利类型

  • 公开/公告日2010-03-10

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20030008447

  • 申请日2003-02-11

  • 分类号G01B11/00;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:25

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