首页> 外国专利> Particle size measuring device e.g. laser particle sizer, for determining particle size distribution of sample material, has reflector device deflecting propagation direction of beam bundles, where movement takes place between pad and cell

Particle size measuring device e.g. laser particle sizer, for determining particle size distribution of sample material, has reflector device deflecting propagation direction of beam bundles, where movement takes place between pad and cell

机译:粒度测量仪激光粒度仪,用于确定样品材料的粒度分布,具有反射器装置,可偏转光束的传播方向,从而在垫板和样品池之间移动

摘要

The device (1) has a light source (10) for generating a monochromatic propagation direction of light beam bundles (11) that defines an optical pad. A propagation direction of the light beam bundles are deflected by a reflector device so that the optical pad is curved. Two measuring cell positions on the optical pad lies upstream and downstream of the reflector device, respectively, where a relative movement takes place between the optical pad and a measuring cell transverse to the optical pad at the measuring cell positions. An independent claim is also included for a method for determination of a particle size distribution of a sample material.
机译:装置(1)具有光源(10),用于产生限定光学垫的光束(11)的单色传播方向。光束束的传播方向被反射器装置偏转,使得光学垫弯曲。光学垫上的两个测量单元位置分别位于反射器设备的上游和下游,在该位置,光学垫和横向于光学垫的测量单元之间在测量单元位置发生相对运动。还包括用于确定样品材料的粒度分布的方法的独立权利要求。

著录项

  • 公开/公告号DE102008064666A1

    专利类型

  • 公开/公告日2010-08-19

    原文格式PDF

  • 申请/专利权人 FRITSCH GMBH;

    申请/专利号DE20081064666

  • 发明设计人 MUTTER WOLFGANG;

    申请日2008-09-15

  • 分类号G01N15/02;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:34

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号