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TEMPERATURE ANALYZING PROGRAM, TEMPERATURE ANALYZING DEVICE, AND TEMPERATURE ANALYZING METHOD

机译:温度分析程序,温度分析装置及温度分析方法

摘要

PROBLEM TO BE SOLVED: To provide a temperature analyzing program, a temperature analyzing device, and a temperature analyzing method that analyze temperatures of a printed board and components mounted on the printed board, in a reflow furnace while preventing analysis precision from falling accompanying reduction in computational complexity.;SOLUTION: The temperature analyzing program that makes a computer analyze the temperatures of the printed board and components in the reflow furnace includes the steps of: generating a simple model having a selected first component arranged on the printed board; setting a lattice for the simple model on the basis of the first component; acquiring a position where a second component other than the first component is mounted on the printed substrate; generating a virtual model by adding a virtual component, based on a size of a component presence lattice corresponding to the acquired position of the second component, to the component presence lattice; and analyzing the virtual model.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种温度分析程序,温度分析装置和温度分析方法,其在回流炉中分析印刷电路板和安装在印刷电路板上的组件的温度,同时防止分析精度随温度降低而下降。解决方案:使计算机分析回流炉中印制板和组件温度的温度分析程序包括以下步骤:生成具有选定第一组件排列在印制板上的简单模型;在第一个组件的基础上为简单模型设置晶格;获取将第一部件以外的第二部件安装在印刷基板上的位置;通过基于与获取的第二部件的位置相对应的部件存在格的大小,将虚拟部件添加到部件存在格来生成虚拟模型;并分析虚拟模型。;版权所有:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011159674A

    专利类型

  • 公开/公告日2011-08-18

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20100017997

  • 发明设计人 OHINATA DAICHI;YAMAURA KAZUYA;

    申请日2010-01-29

  • 分类号H05K3/34;G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 18:25:19

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