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PRECISE PROCESSING METHOD AND DEVICE OF HARD-TO-PROCESS MATERIAL

机译:难加工材料的精密加工方法和装置

摘要

PROBLEM TO BE SOLVED: To provide a precise processing method and a device of a hard-to-process material for high-efficiency generating a scratch-free and damage-free surface of high quality, by having the surface of the hard-to-process material made of a cemented carbide such as SiC, GaN or WC irradiated with high-density radicals generated with an atmospheric-pressure plasma to reform the mechanical properties of the surface to attain easy removal through mechanical polishing, such as, lapping or polishing.;SOLUTION: The method includes a surface reforming process of reforming the surface of the hard-to-process material by making a high-reactivity oxide species generated with the atmospheric-pressure plasma act on the surface to form a surface reformed layer on the hard-to-process material, and a polishing process of selectively removing the surface reformed layer, without introducing a scratch or an affected layer into the hard-to-process material and using a polishing mechanism higher in removing rate to the surface reformed layer than to the hard-to-process material to process the material, by alternately making it repeat or the surface reforming process and the polishing process proceed simultaneously.;COPYRIGHT: (C)2011,JPO&INPIT
机译:要解决的问题:提供一种精确的加工方法和一种难加工材料的装置,以通过使难以加工的材料表面具有高耐刮擦性,从而高效率地产生高质量的无刮擦和无损伤的表面用硬质合金(例如SiC,GaN或WC)制成的加工材料,该材料用大气压等离子体产生的高密度自由基辐照,以重整表面的机械性能,以便通过机械抛光(例如研磨或抛光)轻松去除。 ;解决方案:该方法包括表面重整过程,该过程通过使由常压等离子体产生的高反应性氧化物物种作用于表面,从而在硬质表面上形成表面重整层,从而对难处理材料的表面进行重整加工材料,以及选择性去除表面改性层的抛光工艺,而不会将划痕或受影响的层引入到难加工材料中,并且使用高抛光机理通过交替重复进行或同时进行表面重整过程和抛光过程,对表面重整层的去除率要高于难处理材料的去除率。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011176243A

    专利类型

  • 公开/公告日2011-09-08

    原文格式PDF

  • 申请/专利权人 OSAKA UNIV;

    申请/专利号JP20100041092

  • 发明设计人 YAMAMURA KAZUYA;ZETTSU NOBUYUKI;

    申请日2010-02-25

  • 分类号H01L21/304;B24B37/04;B24B37/00;

  • 国家 JP

  • 入库时间 2022-08-21 18:23:00

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