首页> 外国专利> Method For Producing A Wafer Comprising A Silicon Single Crystal Substrate Having A Front And A Back Side And A Layer of SiGe Deposited On The Front Side

Method For Producing A Wafer Comprising A Silicon Single Crystal Substrate Having A Front And A Back Side And A Layer of SiGe Deposited On The Front Side

机译:晶片的制造方法,该晶片包括硅单晶衬底,该硅单晶衬底具有正面和背面以及在正面沉积的SiGe层

摘要

A method for producing a wafer with a silicon single crystal substrate having a front and a back side and a layer of SiGe deposited on the front side, the method using steps in the following order:simultaneously polishing the front and the back side of the silicon single crystal substrate;depositing a stress compensating layer on the back side of the silicon single crystal substrate;polishing the front side of the silicon single crystal substrate; cleaning the silicon single crystal substrate having the stress compensating layer deposited on the back side; anddepositing a fully or partially relaxed layer of SiGe on the front side of the silicon single crystal substrate.
机译:一种用于制造具有硅单晶衬底的晶片的方法,该硅单晶衬底具有正面和背面以及在其正面上沉积的SiGe层,该方法使用以下顺序的步骤: 同时抛光硅单晶衬底的正面和背面; 在硅单晶衬底的背面沉积应力补偿层 抛光硅单晶衬底的正面;清洁在背面上沉积有应力补偿层的硅单晶衬底;和 在硅单晶衬底的正面沉积一层完全或部分松弛的SiGe层。

著录项

  • 公开/公告号US2010291761A1

    专利类型

  • 公开/公告日2010-11-18

    原文格式PDF

  • 申请/专利权人 PETER STORCK;THOMAS BUSCHHARDT;

    申请/专利号US20100724584

  • 发明设计人 PETER STORCK;THOMAS BUSCHHARDT;

    申请日2010-03-16

  • 分类号H01L21/20;

  • 国家 US

  • 入库时间 2022-08-21 18:14:11

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