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System and method for efficiently testing cache congruence classes during processor design verification and validation

机译:在处理器设计验证和确认期间有效测试高速缓存一致性类的系统和方法

摘要

A system and method for using a single test case to test each sector within multiple congruence classes is presented. A test case generator builds a test case for accessing each sector within a congruence class. Since a congruence class spans multiple congruence pages, the test case generator builds the test case over multiple congruence pages in order for the test case to test the entire congruence class. During design verification and validation, a test case executor modifies a congruence class identifier (e.g., patches a base register), which forces the test case to test a specific congruence class. By incrementing the congruence class identifier after each execution of the test case, the test case executor is able to test each congruence class in the cache using a single test case.
机译:提出了一种用于使用单个测试用例来测试多个一致性类中的每个扇区的系统和方法。测试用例生成器构建一个测试用例,以访问同等类中的每个扇区。由于一致性类跨越多个一致性页面,因此,测试用例生成器会在多个一致性页面上构建测试用例,以使测试用例可以测试整个一致性类。在设计验证和确认期间,测试用例执行器修改一致性类标识符(例如,修补基址寄存器),这迫使测试用例测试特定的一致性类。通过在每次执行测试用例之后递增一致性类标识符,测试用例执行程序就可以使用单个测试用例来测试高速缓存中的每个一致性类。

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