首页> 外国专利> INTERFEROMETER FOR MEASURING PLASMA DENSITY USING A GAUSSIAN BEAM ANTENNA, CAPABLE OF EASILY CONTROLLING THE FOCUS OF MICROWAVE

INTERFEROMETER FOR MEASURING PLASMA DENSITY USING A GAUSSIAN BEAM ANTENNA, CAPABLE OF EASILY CONTROLLING THE FOCUS OF MICROWAVE

机译:使用高斯束天线测量等离子体密度的干涉仪,可轻松控制微波的聚焦

摘要

PURPOSE: An interferometer for measuring plasma density using a Gaussian beam antenna is provided to reduce noise and beam loss because a vacuum window is not required.;CONSTITUTION: An interferometer for measuring plasma density using a Gaussian beam antenna comprises a microwave generator(100), wave guides(600), antennas(500), reflective mirrors(310), beam lenses(200), and a processing unit(110). The microwave generator generates microwave. The wave guides transfer the microwave to the antenna. The antenna emits the transferred microwave. The reflective mirrors reflect the emitted microwave. The beam lenses are integrally fixed to vacuum flanges(710) of a vacuum container(700) and transfer the microwave to the inside the vacuum container. The processing unit detects a phase difference of the microwave passing through plasma.;COPYRIGHT KIPO 2011
机译:用途:提供了一种使用高斯波束天线测量等离子体密度的干涉仪,以减少噪声和波束损耗,因为不需要真空窗口。;组成:一种使用高斯波束天线测量等离子体密度的干涉仪,包括一个微波发生器(100) ,波导(600),天线(500),反射镜(310),光束透镜(200)和处理单元(110)。微波发生器产生微波。波导将微波传输到天线。天线发射转移的微波。反射镜反射发射的微波。束透镜整体地固定在真空容器(700)的真空凸缘(710)上,并将微波转移到真空容器内部。处理单元检测穿过等离子体的微波的相位差。; COPYRIGHT KIPO 2011

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