首页> 外国专利> METHOD FOR MANUFACTURING A PHASE CHANGE MEMORY DEVICE WITH THE IMPROVED DIODE GAP-FILLING PROPERTY, CAPABLE OF COMPLETELY FILLING A SPACED BETWEEN DIODES USING AN INSULATING MATERIAL

METHOD FOR MANUFACTURING A PHASE CHANGE MEMORY DEVICE WITH THE IMPROVED DIODE GAP-FILLING PROPERTY, CAPABLE OF COMPLETELY FILLING A SPACED BETWEEN DIODES USING AN INSULATING MATERIAL

机译:制造具有改进的二极管间隙填充特性的相变存储器的方法,该方法能够使用绝缘材料完全填充二极管之间的空间

摘要

PURPOSE: A method for manufacturing a phase change memory device with the improved diode gap-filling property is provided to effectively prevent the generation of a leakage current by forming an insulating film with an ozone TEOS film and an HDP insulating film.;CONSTITUTION: A semiconductor substrate(100) with a junction word-line(110) is prepared. A metal word-line(120) in electrical connection with the junction word-line is formed on the semiconductor substrate. A schottky diode(130) is formed on the upper side of the metal word-line. A surface protective film(132) is formed to protect the surface of the schottky diode. A first gap-fill insulating film is formed on the upper side of the surface protective film. A second gap-fill insulating film is formed to fill a space between schottky diodes.;COPYRIGHT KIPO 2011
机译:目的:提供一种具有改善的二极管间隙填充特性的相变存储器件的制造方法,以通过用臭氧TEOS膜和HDP绝缘膜形成绝缘膜来有效防止泄漏电流的产生。制备具有结字线(110)的半导体衬底(100)。与结字线电连接的金属字线(120)形成在半导体衬底上。肖特基二极管(130)形成在金属字线的上侧。形成表面保护膜(132)以保护肖特基二极管的表面。在表面保护膜的上侧形成第一间隙填充绝缘膜。形成第二间隙填充绝缘膜以填充肖特基二极管之间的空间。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110011779A

    专利类型

  • 公开/公告日2011-02-09

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090069185

  • 发明设计人 MIN SUNG KYU;

    申请日2009-07-29

  • 分类号H01L21/8247;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:36

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