Method for testing plug-in connector with respect to short-circuits and failures, involves measuring and evaluating undesirable parasite coupling capacitance between contact pins of device under test

摘要

The method involves measuring and evaluating undesirable parasite coupling capacitance (Ck) between contact pins (3) of a device under test (2) using a test head (1), where the parasite coupling capacitance lies in the femtofarad range. A test signal is capacitively coupled/decoupled with/from the contact pins of the device under test, respectively. The test head is guided towards the contact pins of the device under test for measuring and evaluating purposes. Amplitudes of the test signal and a phase of the test signal are evaluated at the test head. An independent claim is also included for a device for testing a plug-in connector.