首页> 外国专利> Method for generation of focal points with arbitrarily oriented three-dimensional electromagnetic field for microscopy of nanoparticles, involves carrying out manipulation of polarization of light of nanoparticles

Method for generation of focal points with arbitrarily oriented three-dimensional electromagnetic field for microscopy of nanoparticles, involves carrying out manipulation of polarization of light of nanoparticles

机译:具有用于纳米粒子的显微镜的任意定向的三维电磁场的焦点的产生方法,涉及对纳米粒子的光的偏振进行操纵

摘要

The method involves carrying out manipulation of the polarization of a light of nanoparticles, where a polarized input radiation beam (21) is divided. A linearly polarized partial radiation beam (41) and another polarized partial radiation beam are generated. An output radiation beam (111) is focused by using a microscope objective to a focus for illuminating a nanoparticle. An independent claim is also included for an apparatus for generation of focal points with arbitrarily oriented three-dimensional electromagnetic field for microscopy of nanoparticles.
机译:该方法包括对纳米颗粒的光的偏振进行操作,其中偏振输入辐射束(21)被分开。产生线偏振的部分辐射束(41)和另一偏振的部分辐射束。通过使用显微镜物镜将输出辐射束(111)聚焦到用于照射纳米粒子的焦点。还包括一种用于产生焦点的设备,该焦点具有用于纳米粒子显微镜的任意取向的三维电磁场。

著录项

  • 公开/公告号DE102009036566A1

    专利类型

  • 公开/公告日2011-02-24

    原文格式PDF

  • 申请/专利权人 TECHNISCHE UNIVERSITAET DRESDEN;

    申请/专利号DE20091036566

  • 发明设计人 ENG LUKAS M.;OLK PHILLIP;

    申请日2009-07-31

  • 分类号G02B21/00;G02B21/06;G02B27/10;B82B3/00;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:45

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