首页> 外国专利> CRYSTAL DIFFRACTION MEASUREMENT METHOD AND DIFFRACTION MEASUREMENT DEVICE FOR THE SAME

CRYSTAL DIFFRACTION MEASUREMENT METHOD AND DIFFRACTION MEASUREMENT DEVICE FOR THE SAME

机译:相同的晶体衍射测量方法和衍射测量装置

摘要

PROBLEM TO BE SOLVED: To provide a method and device for preventing a water-containing crystal from drying to appropriately freeze a sample during diffraction measurement by X-rays etc.;SOLUTION: The X-ray diffraction measurement method for a water-containing crystal includes a process of encapsulating a crystal in a water-soluble polymer.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种防止含水晶体干燥的方法和装置,以在通过X射线等进行衍射测量期间适当地冻结样品;解决方案:用于含水晶体的X射线衍射测量方法包括将晶体包裹在水溶性聚合物中的过程。版权所有:(C)2012,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号