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SURFACE PROPERTY MEASURING APPARATUS AND COMPREHENSIVE EVALUATION METHOD FOR SURFACE PROPERTY

机译:表面性能测量装置及表面性能综合评价方法

摘要

PROBLEM TO BE SOLVED: To quantitatively and comprehensively evaluate the surface property of a surface close to a mirror surface based on an intex close to a unique sensitivity of each product or business field.;SOLUTION: A mirror surface instrument 1 is configured to project, by a computer control, a check pattern displayed on a display 11, to a measuring object surface 21, capture a reflection image by an image pickup device 12, acquire the image data and cause the computer 3 to process the data. The surface property measuring apparatus, using the mirror surface instrument 1, imports in the computer 3, computer software 5 including calculation logic of a plurality of measurement items such as mirror specularity, mirror specularity variation, glossiness, sharpness, waviness or shape error, contrast and white turbidity, automatically and sequentially measure the plurality of measurement items, and evaluate the surface property with the plurality of measurement items including the mirror specularity used as indices.;COPYRIGHT: (C)2013,JPO&INPIT
机译:要解决的问题:要基于接近于每个产品或业务领域的唯一灵敏度的整数来定量,全面地评估接近镜面的表面的表面特性。解决方案:镜面仪器1配置为投射,通过计算机控制,显示在显示器11上的检查图案到达测量对象表面21,由图像拾取装置12捕获反射图像,获取图像数据并使计算机3处理该数据。使用镜面仪器1的表面特性测量装置在计算机3中导入计算机软件5,该计算机软件5包括诸如镜面反射率,镜面反射率变化,光泽度,清晰度,波纹度或形状误差,对比度等多个测量项目的计算逻辑。和白浊度,自动依次测量多个测量项目,并使用包括镜面镜面反射度在内的多个测量项目评估表面性能。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2012215486A

    专利类型

  • 公开/公告日2012-11-08

    原文格式PDF

  • 申请/专利权人 ARC HARIMA KK;

    申请/专利号JP20110081427

  • 发明设计人 SHIBATA KAZUHISA;

    申请日2011-04-01

  • 分类号G01N21/57;G01B11/25;G01B11/30;

  • 国家 JP

  • 入库时间 2022-08-21 17:43:44

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