首页> 外国专利> ENTIRE LIGHT QUANTITY MEASURING SYSTEM, ENTIRE LIGHT QUANTITY MEASURING DEVICE, AND ENTIRE LIGHT QUANTITY MEASURING METHOD

ENTIRE LIGHT QUANTITY MEASURING SYSTEM, ENTIRE LIGHT QUANTITY MEASURING DEVICE, AND ENTIRE LIGHT QUANTITY MEASURING METHOD

机译:整光量测量系统,整光量测量装置及整光量测量方法

摘要

PROBLEM TO BE SOLVED: To provide an entire light quantity measuring system capable of measuring the entire light quantity of a light source which is mounted on a substrate even under a bright environment.;SOLUTION: The entire light quantity measuring system comprises a first housing 101 having a reflecting surface portion 113 reflecting light on its inner surface, a first opening 111 through which direct light and reflection light pass, and a first insertion hole 112 for displacing a light source 300; a second housing 102 having a second opening 121, a second insertion hole 122, and an absorbing surface portion 123 absorbing light on its inner surface; detecting means 103 detecting first light quantity and second light quantity; computing means 104 calculating the entire light quantity; a flexible first light-shielding member 141 preventing stray light from entering a first space 110; and a flexible second light-shielding member 142 preventing stray light from entering a second space 120.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种即使在明亮的环境下也能够测量安装在基板上的光源的整体光量的整体光量测量系统。解决方案:整体光量测量系统包括第一壳体101。具有在其内表面上反射光的反射表面部分113,使直接光和反射光穿过的第一开口111以及用于使光源300移位的第一插入孔112;第二壳体102具有第二开口121,第二插入孔122和在其内表面吸收光的吸收表面部分123;检测装置103检测第一光量和第二光量;计算装置104计算全部光量;柔性的第一遮光构件141,用于防止杂散光进入第一空间110。柔性第二遮光构件142防止杂散光进入第二空间120。版权所有:(C)2012,日本特许经营&INPIT

著录项

  • 公开/公告号JP2012013547A

    专利类型

  • 公开/公告日2012-01-19

    原文格式PDF

  • 申请/专利权人 PANASONIC CORP;

    申请/专利号JP20100150467

  • 发明设计人 HIROTA MAKI;NAMIKI SHU;

    申请日2010-06-30

  • 分类号G01J1/02;G01J1;G01M11;

  • 国家 JP

  • 入库时间 2022-08-21 17:43:07

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