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Organic and the plasma etching remainder of the semiconductor device in order to exfoliate

机译:半导体器件的有机和等离子蚀刻残留物,以去除角质

摘要

In order to exfoliate the photoresist from the baseplate, from the baseplate the etching remainder in order to wash and being the composition in order to etch silicon dioxide, approximately 0.01 - approximately 10 mass % the fluoride compound of 1 kinds or more, approximately 10 - approximately 95 mass % organic sulfoxide or the sulfonic solvent, and approximately 20 - approximately 50 mass % the composition which features that the water is included. The composition of this invention the corrosion inhibiter and the chelation medicine, the auxiliary solvent, the basic amine compound, the surface active agent, as needed may include acid and the base.
机译:为了从基板上剥落光致抗蚀剂,从基板上去除残留的残留物以进行清洗,并且为了蚀刻二氧化硅而将其作为组合物以蚀刻二氧化硅,其中,约0.01〜约10质量%的1种以上的氟化物,约10〜包含水的组合物为约95质量%的有机亚砜或磺酸溶剂,约20〜约50质量%。本发明的组合物根据需要,缓蚀剂和螯合剂,辅助溶剂,碱性胺化合物,表面活性剂可以包括酸和碱。

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