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Optical tomographic image acquisition method and an optical tomographic imaging apparatus

机译:光学断层图像获取方法和光学断层图像摄像设备

摘要

PPROBLEM TO BE SOLVED: To provide an optical tomographic image acquisition method capable of generating a tomographic image having high resolution efficiently and simply. PSOLUTION: This method has a contact domain detection step for detecting a contact state between the outer periphery of an optical probe and a measuring object, and detecting a contact domain from a detection result of the contact state; an interference signal acquisition step for generating interference light by acquiring reflected light, while rotating a measuring part, and acquiring the interference light as an interference signal; and a sectional image acquisition step for acquiring a sectional image by processing the interference signal by the first processing condition, when the interference signal is an interference signal generated from reflected light reflected from the measuring object in the contact domain, and by processing the interference signal by the second processing condition, when the interference signal is an interference signal generated from reflected light reflected from the measuring object in a domain other than the contact domain. The first processing condition is a condition having higher processing accuracy than the second processing condition. PCOPYRIGHT: (C)2009,JPO&INPIT
机译:

要解决的问题:提供一种光学断层图像获取方法,该方法能够高效且简单地生成具有高分辨率的断层图像。

解决方案:该方法具有接触域检测步骤,用于检测光学探针的外周与测量对象之间的接触状态,并根据接触状态的检测结果来检测接触域。干涉信号获取步骤,其通过在旋转测量部分的同时获取反射光并产生干涉光作为干涉信号来产生干涉光;断面图像获取步骤,其中,当所述干扰信号是从所述测量对象在接触域中反射的反射光产生的干扰信号时,通过以所述第一处理条件处理所述干扰信号来获取断面图像,并且通过处理所述干扰信号来获取断面图像。通过第二处理条件,当干涉信号是从在接触域以外的域中从测量对象反射的反射光产生的干涉信号时。第一处理条件是具有比第二处理条件更高的处理精度的条件。

版权:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP4874906B2

    专利类型

  • 公开/公告日2012-02-15

    原文格式PDF

  • 申请/专利权人 富士フイルム株式会社;

    申请/专利号JP20070242457

  • 发明设计人 小澤 聡;

    申请日2007-09-19

  • 分类号G01N21/17;A61B1/00;

  • 国家 JP

  • 入库时间 2022-08-21 17:38:11

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