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Transistor size design methods and transistor size design apparatus

机译:晶体管尺寸设计方法和晶体管尺寸设计装置

摘要

PROBLEM TO BE SOLVED: To provide a method for designing transistor size capable of remarkably reducing a design period unnecessary in simulation of circuit data in cell library cell design in the method for designing the transistor size in layout design of each cell of a cell library for semiconductor integrated circuit design. ;SOLUTION: The method is provided with a stage for promoting input of data for simulation of a pair of circuits connecting a drive element as an input side and a load element as an output side on each division combination by dividing a plurality of basic logic elements into the drive element and the load element, a stage for making the transistor size a parameter every input paired circuit, performing circuit operation simulation and obtaining characteristic information including at least an operation speed every paired circuit as the transistor size is made the parameter, and a stage for finding the optimum value of the transistor size from the characteristic information every paired circuit obtained on each cell of the cell library and the circuit data of a cell.;COPYRIGHT: (C)2003,JPO
机译:解决的问题:提供一种用于设计晶体管尺寸的方法,该方法能够显着地减少在用于单元库的每个单元的布局设计中的晶体管尺寸的设计方法中在单元库单元设计中的电路数据仿真中不必要的设计周期。半导体集成电路设计。 ;解决方案:该方法设有一个阶段,用于通过分割多个基本逻辑元件来促进数据输入,以模拟在每个分割组合上连接作为输入侧的驱动元件和作为输出侧的负载元件的一对电路在驱动元件和负载元件中,用于使晶体管尺寸成为每个输入的成对电路的参数,执行电路操作仿真并获得至少包括作为晶体管尺寸的每个成对电路的操作速度的特性信息的阶段,以及一个阶段,用于从在单元库的每个单元上获得的每个配对电路的特性信息和一个单元的电路数据中找到晶体管尺寸的最佳值。;版权:(C)2003,JPO

著录项

  • 公开/公告号JP4894106B2

    专利类型

  • 公开/公告日2012-03-14

    原文格式PDF

  • 申请/专利权人 凸版印刷株式会社;

    申请/专利号JP20010233716

  • 发明设计人 山口 洋城;佐々木 浩仁;

    申请日2001-08-01

  • 分类号H01L21/82;G06F17/50;H01L27/04;H01L21/822;

  • 国家 JP

  • 入库时间 2022-08-21 17:38:06

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