首页> 外国专利> In the oxygen precipitation behavior forecasting manner in the silicon monocrystal which forecasts the behavior of the oxygen deposit which is generated in the silicon monocrystal oxygen precipitation behavior forecasting manner in the silicon monocrystal

In the oxygen precipitation behavior forecasting manner in the silicon monocrystal which forecasts the behavior of the oxygen deposit which is generated in the silicon monocrystal oxygen precipitation behavior forecasting manner in the silicon monocrystal

机译:以预测单晶硅中产生的氧沉积行为的单晶硅中的氧沉淀行为预测方式,以单晶硅中的氧沉淀行为预测方式预测氧沉积行为

摘要

Density of the thermal donor who occurs according to the heat history between the 550C from the 400C which early oxygen density and the silicon monocrystal in the silicon monocrystal receive the case of grain growth and, nuclear occurrence speed of the oxygen deposit which when it heat-treated the silicon monocrystal with the heat treatment process occurs in the silicon monocrystal is calculated by specifying. Furthermore density and the oxygen precipitation quantity of the oxygen deposit in the heat treatment condition for adding to the silicon monocrystal optional heat treatment condition by specifying, are estimated with operation.
机译:早期氧密度和单晶硅中的单晶硅在接受生长时从550°C到550°C之间的热历史而产生的热供体的密度,以及在加热时氧沉积的核生成速度-经热处理的单晶硅的热处理过程中发生的单晶硅是通过规定计算的。进而,通过运算来估计在用于添加到单晶硅的任意热处理条件的热处理条件下的氧析出物的密度和氧析出量。

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