Apparatus and methods of generating a test pattern of data, analysing a test pattern of data, and testing a data storage disk medium and/or a read/write head

摘要

A method of generating a test pattern of data to be written to a data storage disk medium for testing includes: rotating the disk; detecting fluctuations in the speed of rotation of the disk; producing a reference clock signal in accordance with the fluctuations so as to be synchronized with the rotation of the disk; and, generating a test pattern of data using the reference clock signal as a timing reference. An apparatus for generating a test pattern of data includes a spindle for rotating a disk; a detector arranged to detect fluctuations in the speed of rotation of the disk; a processor arranged to produce a reference clock signal in accordance with fluctuations so as to be synchronized with the rotation of the disk; and, a pattern generator arranged to generate a test pattern of data using the reference clock signal as a timing reference.