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System for Inspecting Defects on Glass Substrate Using Contrast Value, and Method of the same
System for Inspecting Defects on Glass Substrate Using Contrast Value, and Method of the same
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机译:利用对比度值检查玻璃基板上的缺陷的系统及其方法
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摘要
The present invention relates to a foreign object detection system and method on the glass substrate, a camera and illumination device In the upper side and the other side of the glass substrate by using the upper and lower end portions of each shot, and the glass substrate, and using the luminance value of the captured image to detect the position of the foreign matter on the glass substrate. ; For this purpose, foreign object detection method on the glass substrate using a luminance value according to the present invention, (a) a glass substrate and transferring a foreign object detection system; (B) the upper side of the glass substrate by using an illumination device (or, lower) reflecting the light, in the upper side of the glass substrate, and align the position and focal length of the camera and the method for recording an upper end of the glass substrate; (C) a step of photographing the lower end of the glass substrate at the upper side by adjusting the focal length of the camera, if any foreign objects in the image of the shooting, and an upper end; (D) and the step of determining that there is a large foreign object luminance value of the luminance value by calculating each of the top and bottom of the image taken in the image side of the glass substrate; (E) the lower side of the glass substrate (or, upper) moving the camera and the illumination device to light the light in the glass substrate, and the lower end of the glass substrate at the lower side after aligning the position and focal length of the camera Steps to shoot with; (F) step for recording an upper end of the glass substrate from the lower side to adjust the focal length of the camera, if any foreign objects in the image of the shooting, and a lower end; And (g) determining that there is a foreign object on the brightness value is greater than the lower end portion and the respective calculated brightness values of the image of the top-up from the lower side of the glass substrate; and a
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