首页> 外国专利> System for Inspecting Defects on Glass Substrate Using Contrast Value, and Method of the same

System for Inspecting Defects on Glass Substrate Using Contrast Value, and Method of the same

机译:利用对比度值检查玻璃基板上的缺陷的系统及其方法

摘要

The present invention relates to a foreign object detection system and method on the glass substrate, a camera and illumination device In the upper side and the other side of the glass substrate by using the upper and lower end portions of each shot, and the glass substrate, and using the luminance value of the captured image to detect the position of the foreign matter on the glass substrate. ; For this purpose, foreign object detection method on the glass substrate using a luminance value according to the present invention, (a) a glass substrate and transferring a foreign object detection system; (B) the upper side of the glass substrate by using an illumination device (or, lower) reflecting the light, in the upper side of the glass substrate, and align the position and focal length of the camera and the method for recording an upper end of the glass substrate; (C) a step of photographing the lower end of the glass substrate at the upper side by adjusting the focal length of the camera, if any foreign objects in the image of the shooting, and an upper end; (D) and the step of determining that there is a large foreign object luminance value of the luminance value by calculating each of the top and bottom of the image taken in the image side of the glass substrate; (E) the lower side of the glass substrate (or, upper) moving the camera and the illumination device to light the light in the glass substrate, and the lower end of the glass substrate at the lower side after aligning the position and focal length of the camera Steps to shoot with; (F) step for recording an upper end of the glass substrate from the lower side to adjust the focal length of the camera, if any foreign objects in the image of the shooting, and a lower end; And (g) determining that there is a foreign object on the brightness value is greater than the lower end portion and the respective calculated brightness values of the image of the top-up from the lower side of the glass substrate; and a
机译:玻璃基板上的异物检测系统和方法,照相机和照明装置技术领域本发明涉及一种在玻璃基板上的异物检测系统和方法,通过使用每个镜头的上,下端部在玻璃基板的上侧和另一侧的照相机和照明装置以及玻璃基板,并使用捕获图像的亮度值来检测异物在玻璃基板上的位置。 ;为此目的,根据本发明的使用亮度值的玻璃基板上的异物检测方法,(a)玻璃基板并转移异物检测系统; (B)在玻璃基板的上侧通过使用反射光的照明装置(或下部)将玻璃基板的上侧对准玻璃基板的上侧,并对准照相机的位置和焦距以及用于记录上部的方法玻璃基板的末端; (C)通过调节照相机的焦距(如果拍摄的图像中有任何异物),在上侧拍摄玻璃基板的下端和上端的步骤; (D)和通过计算在玻璃基板的图像侧拍摄的图像的顶部和底部中的每一个来确定亮度值的异物亮度值大的步骤; (E)移动照相机和照明装置以使玻璃基板中的光移动的玻璃基板的下侧(或上方),对准位置和焦距后,玻璃基板的下端位于下侧相机的拍摄步骤; (F)从下侧记录玻璃基板的上端以调节照相机的焦距的步骤,如果拍摄的图像中有异物,则下端;并且(g)确定在亮度值大于玻璃基板的下端的下端部分和相应计算的图像的亮度值上存在异物;和一个

著录项

  • 公开/公告号KR101094968B1

    专利类型

  • 公开/公告日2011-12-15

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20090012303

  • 发明设计人 유근홍;

    申请日2009-02-16

  • 分类号G01B11/28;G01N21/88;

  • 国家 KR

  • 入库时间 2022-08-21 17:11:00

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