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METHOD FOR DETERMINING A DATA VALID WINDOW IN A SYSTEM AND METHOD FOR TESTING AN INTEGRATED CIRCUIT DEVICE CAPABLE OF IDENTIFYING A DATA VALID WINDOW PROPERTY WITH REGARD TO THE INTEGRATED CIRCUIT DEVICE
METHOD FOR DETERMINING A DATA VALID WINDOW IN A SYSTEM AND METHOD FOR TESTING AN INTEGRATED CIRCUIT DEVICE CAPABLE OF IDENTIFYING A DATA VALID WINDOW PROPERTY WITH REGARD TO THE INTEGRATED CIRCUIT DEVICE
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机译:在系统中确定数据有效窗口的方法和用于测试能够确定数据有效窗口属性的集成电路设备的方法
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摘要
PURPOSE: A method for determining a data valid window in a system and method for testing an integrated circuit device is provided to determine a data valid window property for identifying a component of a response data signal from a device.;CONSTITUTION: A tester(10) includes a program memory(12), a controller(14), a microprocessor(16), a TVPG(Text Vector Pattern Generator)(18), and a comparator block(19). The microprocessor searches a command from the program memory and commands the TVGP to generate a digital expression of a test vector pattern in response to the command. The TVPG transmits the command to the controller. The controller communicates with a DUT(Device Under Test)(20) through a communication channel(6). The controller receives the test vector pattern, converts the test vector pattern into an electric waveform, and outputs the electric waveform to the DUT through a communication channel.;COPYRIGHT KIPO 2012
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