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BURN-IN DEVICE, A BURN-IN SYSTEM, A METHOD FOR CONTROLLING THE BURN-IN DEVICE, AND A METHOD FOR CONTROLLING THE BURN-IN SYSTEM CAPABLE OF EXCLUDING AN ARBITRARY DEVICE UNDER TEST
BURN-IN DEVICE, A BURN-IN SYSTEM, A METHOD FOR CONTROLLING THE BURN-IN DEVICE, AND A METHOD FOR CONTROLLING THE BURN-IN SYSTEM CAPABLE OF EXCLUDING AN ARBITRARY DEVICE UNDER TEST
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机译:内置设备,内置系统,用于控制内置设备的方法以及用于控制可在测试中排除任意设备的内置系统的方法
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摘要
PURPOSE: A burn-in device, a burn-in system, a method for controlling the burn-in device, and a method for controlling the burn-in system are provided to reduce a test time.;CONSTITUTION: A test control apparatus(100) comprises a test pattern output circuit(210) and a device selection signal output circuit(220). The device selection signal output circuit outputs a device selection signal in a burn-in board. The test pattern output circuit outputs test pattern data provided to the device under test in the burn-in board. The device selection signal output circuit has a mask setting memory. The device selection signal output circuit prevents the selection of the device under test specified to mask configuration data.;COPYRIGHT KIPO 2012
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