首页> 外国专利> CONTROLLER FOR A MEMORY, A STORAGE SYSTEM INCLUDING THE SAME, AND A METHOD FOR MEASURING A LIFETIME OF THE MEMORY BY COMPARING INITIAL OPERATION TIME WITH THE PERIODICALLY MEASURED OPERATION TIME OF THE MEMORY

CONTROLLER FOR A MEMORY, A STORAGE SYSTEM INCLUDING THE SAME, AND A METHOD FOR MEASURING A LIFETIME OF THE MEMORY BY COMPARING INITIAL OPERATION TIME WITH THE PERIODICALLY MEASURED OPERATION TIME OF THE MEMORY

机译:存储器控制器,包括该存储器的存储系统以及通过将初始操作时间与该存储器的定期测量操作时间进行比较来测量该存储器寿命的方法

摘要

PURPOSE: A controller for a memory, a storage system including the same, and a method for measuring a lifetime of the memory are provided to accurately measure a lifetime of a nonvolatile memory based on the program time or erase time of the nonvolatile memory.;CONSTITUTION: The initial operation time of a memory is measured(S410). The initial operation time is stored(S420). The operation time of the memory is measured(S430). Lifetime information is generated by comparing the measured operation time with the initial operation time(S440).;COPYRIGHT KIPO 2012
机译:目的:提供一种用于存储器的控制器,包括该控制器的存储系统以及用于测量存储器的寿命的方法,以基于非易失性存储器的编程时间或擦除时间来准确地测量非易失性存储器的寿命。构成:测量存储器的初始操作时间(S410)。存储初始操作时间(S420)。测量存储器的操作时间(S430)。通过将测得的操作时间与初始操作时间进行比较来生成寿命信息(S440)。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120062075A

    专利类型

  • 公开/公告日2012-06-14

    原文格式PDF

  • 申请/专利权人 SK HYNIX INC.;

    申请/专利号KR20100123166

  • 发明设计人 SHIN YOUNG KYUN;

    申请日2010-12-06

  • 分类号G11C16/34;G11C16/32;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:48

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