首页> 外国专利> ANALYSIS SYSTEM USING AN INTERFEROMETER AND A CONTROL METHOD THEREOF, CAPABLE OF OPTIMIZING PERFORMANCE OF AN INTERFEROMETER BY ADJUSTING A LENGTH OF A CAVITY

ANALYSIS SYSTEM USING AN INTERFEROMETER AND A CONTROL METHOD THEREOF, CAPABLE OF OPTIMIZING PERFORMANCE OF AN INTERFEROMETER BY ADJUSTING A LENGTH OF A CAVITY

机译:使用干涉仪的分析系统及其控制方法,能够通过调节腔的长度来优化干涉仪的性能

摘要

PURPOSE: An analysis system using an interferometer and a control method thereof are provided to improve the interference performance of an interferometer by changing a length of a cavity according to a wavelength of incident lights.;CONSTITUTION: An analysis system using an interferometer comprises a beam irradiating device, a beam collecting device, a cavity(200), a path setting device(400), and an analysis device(300). The beam irradiating device irradiates laser beams to a target. The beam collecting device collects the beam emitted from the target. The cavity reflects the collected beams to an input terminal or outputs by resonating. The path setting device transmits the transmitted beams from the beam collecting device to the cavity and output beams output from the cavity to the analysis device. The analysis device analyzes properties of the target by using the beams output from the cavity.;COPYRIGHT KIPO 2012
机译:目的:提供一种使用干涉仪的分析系统及其控制方法,以通过根据入射光的波长改变腔体的长度来改善干涉仪的干涉性能。构成:使用干涉仪的分析系统包括光束照射装置,射束收集装置,腔(200),路径设定装置(400)和分析装置(300)。光束照射装置将激光束照射到目标。光束收集装置收集从目标发射的光束。腔通过共振将收集的光束反射到输入端子或输出。路径设定装置将来自束收集装置的透射束传输至腔,并且将从腔输出的输出束传输至分析装置。该分析设备通过使用从腔体输出的光束来分析目标的属性。; COPYRIGHT KIPO 2012

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