首页> 外国专利> METHOD FOR MEASURING THE HEIGHT OF A PCB BUMP THROUGH A THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE USING OPTICAL TRIANGULATION, CAPABLE OF ENHANCING THE HEIGHT MEASUREMENT ACCURACY OF BUMP BALLS OF AN IC CHIP

METHOD FOR MEASURING THE HEIGHT OF A PCB BUMP THROUGH A THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE USING OPTICAL TRIANGULATION, CAPABLE OF ENHANCING THE HEIGHT MEASUREMENT ACCURACY OF BUMP BALLS OF AN IC CHIP

机译:利用光学三角测量通过三维形状测量装置测量PCB凸起高度的方法,可增强IC芯片凸起球的高度测量精度

摘要

PURPOSE: A method for measuring the height of a PCB bump through a three-dimensional shape measurement device using optical triangulation is provided to measure the height of an un-visible portion of a pump ball of an IC chip and to make a bidirectional measurement possible at the same time.;CONSTITUTION: A method for measuring the height of a PCB bump through a three-dimensional shape measurement device using optical triangulation is as follows. A left or right laser optical system being symmetrically constituted of a computer vision system(10) being connected to a controller of an optical sensor and a semiconductor PCB inspecting device selectively or simultaneously projects laser beams to bump balls of an IC chip with lenses being respectively tilted at a predetermined angle and scans the bump balls of the IC chip while moving the IC chip with a transferring device. When the laser beam is projected to the IC chip from the left or right laser optical system, reflected lights are detected with a CCD camera(20) and an optical sensor so that the height of a bump of the IC chip is measured by using optical triangulation according to a length change of an image. When measuring with one of the left and right laser optical system, the measured height of the bump balls of the IC chip is provided. When simultaneously measuring with both left and right laser optical system, the height of each bump ball of the IC chip is calculated by calculating and averaging measured two height values of the bump ball of the IC chip.;COPYRIGHT KIPO 2012
机译:目的:提供一种通过使用光学三角测量的三维形状测量设备测量PCB凸块高度的方法,以测量IC芯片泵浦球的不可见部分的高度并使双向测量成为可能组成:一种通过使用光学三角测量的三维形状测量设备测量PCB凸块高度的方法如下。左右激光光学系统对称地由连接到光学传感器的控制器的计算机视觉系统(10)和半导体PCB检查设备选择性地或同时将激光束投射到带有透镜的IC芯片的凸球上以预定角度倾斜并在用传送装置移动IC芯片的同时扫描IC芯片的凸球。当激光束从左或右激光光学系统投射到IC芯片上时,反射光由CCD摄像机(20)和光学传感器检测到,从而通过光学方式测量IC芯片凸点的高度根据图像的长度变化进行三角剖分。当使用左右激光光学系统之一进行测量时,将提供测得的IC芯片凸点球的高度。当同时使用左右激光光学系统进行测量时,通过计算和平均测得的IC芯片凸点球的两个高度值来计算IC芯片每个凸点球的高度。; COPYRIGHT KIPO 2012

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