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ULTRA RESOLUTION MICROSCOPE SYSTEM CAPABLE OF OBTAINING AN IMAGE ABOUT FLUORESCENCE LIGHT SOURCES OF AN OBJECT IN HIGH RESOLUTION AND AN IMAGE OBTAINING METHOD USING THE SAME
ULTRA RESOLUTION MICROSCOPE SYSTEM CAPABLE OF OBTAINING AN IMAGE ABOUT FLUORESCENCE LIGHT SOURCES OF AN OBJECT IN HIGH RESOLUTION AND AN IMAGE OBTAINING METHOD USING THE SAME
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机译:能够获得关于物体的荧光光源的图像的超高分辨率显微镜系统以及使用该图像的方法
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摘要
PURPOSE: An ultra resolution microscope system and an image obtaining method using the same are provided to obtain an image in ultra resolution of a nanometer degree by using an irregular pattern and an alignment signal processing technique.;CONSTITUTION: A scattering pattern generator(110) passes transmitted light through a scattering unit to photograph fluorescent light sources of an object. An incident optical system(120) inserts a scattering pattern generated by one or more optical lenses into a specimen. A fluorescent optical image system(130) passes the inserted scattering pattern through one or more excitation filters and fluorescent filters in order.;COPYRIGHT KIPO 2013;[Reference numerals] (110) Scattering pattern generator; (120) Incident optical system; (130) Fluorescent optical image system; (140) Image restoration algorithm
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