首页> 外国专利> Measurement device for e.g. evaluating infrared application and classification, has measuring space, which is designed in hemispherical and spherical manner and provided with infrared light reflective layer at innermost surface

Measurement device for e.g. evaluating infrared application and classification, has measuring space, which is designed in hemispherical and spherical manner and provided with infrared light reflective layer at innermost surface

机译:测量设备例如评估红外应用和分类,具有测量空间,该测量空间以半球形和球形方式设计,并且在最内表面具有红外光反射层

摘要

The device has a measuring space, which is designed in a hemispherical and spherical manner. The measuring space is provided with an infrared light reflective layer at an innermost surface. The measuring space is defined by an infrared light transmitting sensor plate and formed by a vacuum complete light transmitter. A contact surface of a radiation emitter holds the measuring device by the light transmitter. The plate and the measuring space are disconnected by gas-tight insulation bodies. A measurement surface is limited with soft gas-tight overlay edge that is made from plastic material.
机译:该设备具有测量空间,该测量空间以半球形和球形的方式设计。测量空间在最内表面处设有红外光反射层。测量空间由红外光透射传感器板限定,并由真空完全光透射器形成。辐射发射器的接触面通过光发射器固定测量装置。板和测量空间通过气密的绝缘体断开。测量表面限制了由塑料材料制成的柔软气密覆盖边缘。

著录项

  • 公开/公告号DE102010027043A1

    专利类型

  • 公开/公告日2012-01-19

    原文格式PDF

  • 申请/专利权人 EBERHARD STRIENZ GMBH;

    申请/专利号DE20101027043

  • 发明设计人 ANTRAG AUF NICHTNENNUNG;

    申请日2010-07-14

  • 分类号G01J5/12;

  • 国家 DE

  • 入库时间 2022-08-21 17:05:31

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