首页> 外国专利> POLARIZATION CHANGE SPECTRUM MEASURING DEVICE, POLARIZATION CHANGE SPECTRUM MEASURING METHOD, MAGNETO-OPTICAL EFFECT MEASURING DEVICE AND MAGNETO-OPTICAL EFFECT MEASURING METHOD

POLARIZATION CHANGE SPECTRUM MEASURING DEVICE, POLARIZATION CHANGE SPECTRUM MEASURING METHOD, MAGNETO-OPTICAL EFFECT MEASURING DEVICE AND MAGNETO-OPTICAL EFFECT MEASURING METHOD

机译:极化变化谱测量装置,极化变化谱测量方法,磁光效应测量装置和磁光效应测量方法

摘要

PROBLEM TO BE SOLVED: To shorten a time required for measuring wavelength dependence of an angle change of a plane of polarization in a material.;SOLUTION: A magneto-optical effect measuring device 10 comprises: a white light source 1 for generating white light; a polarizer 2 for forming linearly polarized light from the white light and making the linearly polarized light incident on a sample S; an electromagnet for applying a magnetic field to the sample S; an analyzer 5 on which detection light emitted from the sample S is made incident; a spectrometer 7 on which a passed light passed through the analyzer 5 is made incident; an optical sensor 8 for detecting respective light intensities of wavelength components with different wavelengths obtained by splitting light by the spectrometer 7; and an arithmetic unit 9 for calculating wavelength dependence of magneto-optical characteristics of the sample S from respective light intensities of the detected wavelength components.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:缩短测量材料中的偏振面的角度变化的波长依赖性所需的时间。偏振器2,用于从白光形成线偏振光,并使线偏振光入射到样品S上。用于向样品S施加磁场的电磁体;从检体S发出的检测光入射到检偏器5。光谱仪7入射通过分析仪5的光。光学传感器8,其检测由分光计7分光后的具有不同波长的波长成分的各自的光强度。运算单元9;和运算单元9,用于根据所检测的波长分量的各个光强度来计算样品S的磁光特性的波长依赖性。;版权所有:(C)2013,JPO&INPIT

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