首页> 外国专利> Verification device of semiconductor integrated circuit, verification method of semiconductor integrated circuit, and computer readable medium storing verification program of semiconductor integrated circuit

Verification device of semiconductor integrated circuit, verification method of semiconductor integrated circuit, and computer readable medium storing verification program of semiconductor integrated circuit

机译:半导体集成电路的验证装置,半导体集成电路的验证方法以及存储半导体集成电路的验证程序的计算机可读介质

摘要

According to one embodiment, a verification device of semiconductor integrated circuit includes an assertion based verification unit, a logic generating unit, a signal restriction generating unit, and an estimation unit. The assertion based verification unit performs assertion based verification of the circuit description based on the assertion description, and generates pass information when the operation of the signal described in the assertion description conforming to a preliminary condition is observed in the circuit description, or generates failure information when the operation of the signal is not observed in the circuit description. The logic generating unit extracts a signal corresponding to the failure information from the assertion description, and generates an input/output logic of the circuit description from the extracted signal. The signal restriction generating unit generates a signal restriction based on the input/output logic. The estimating unit evaluates the validity of the signal restriction.
机译:根据一个实施例,一种半导体集成电路的验证装置包括:基于断言的验证单元,逻辑生成单元,信号限制生成单元和估计单元。基于断言的验证单元基于断言描述对电路描述进行基于断言的验证,并在电路描述中观察到断言描述中描述的符合初始条件的信号的操作时生成通过信息,或者生成故障信息当在电路说明中未观察到信号操作时。逻辑生成单元从断言描述中提取与故障信息相对应的信号,并从提取的信号中生成电路描述的输入/输出逻辑。信号限制生成单元基于输入/输出逻辑来生成信号限制。估计单元评估信号限制的有效性。

著录项

  • 公开/公告号US8516419B2

    专利类型

  • 公开/公告日2013-08-20

    原文格式PDF

  • 申请/专利权人 TAKEHIKO TSUCHIYA;

    申请/专利号US20090405400

  • 发明设计人 TAKEHIKO TSUCHIYA;

    申请日2009-03-17

  • 分类号G06F9/455;G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 16:46:46

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