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Method and system for a process sensor to compensate SoC parameters in the presence of IC process manufacturing variations
Method and system for a process sensor to compensate SoC parameters in the presence of IC process manufacturing variations
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机译:在集成电路制造工艺变化的情况下,用于过程传感器补偿SoC参数的方法和系统
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摘要
Certain aspects of a method and system for a process sensor to compensate SoC parameters in the presence of IC process manufacturing variations are disclosed. Aspects of one method may include determining an amount of process variation associated with at least one transistor within a single integrated circuit. The determined amount of process variation may be compensated by utilizing a process dependent current, a bandgap current, and a current associated with a present temperature of the transistor. The process dependent current, the bandgap current and the current associated with the present temperature of the transistor may be combined to generate an output current. A voltage generated across a variable resistor may be determined based on the generated output current.
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