首页> 外国专利> METHOD FOR DETERMINING LAMINATE DIRECTION FOR LAMINATE TYPE ELECTRONIC COMPONENT, LAMINATE DIRECTION DETERMINATION DEVICE FOR LAMINATE TYPE ELECTRONIC COMPONENT, METHOD FOR MANUFACTURING SERIAL LAMINATE TYPE ELECTRONIC COMPONENT, AND MANUFACTURING DEVICE FOR SERIAL LAMINATE TYPE ELECTRONIC COMPONENT

METHOD FOR DETERMINING LAMINATE DIRECTION FOR LAMINATE TYPE ELECTRONIC COMPONENT, LAMINATE DIRECTION DETERMINATION DEVICE FOR LAMINATE TYPE ELECTRONIC COMPONENT, METHOD FOR MANUFACTURING SERIAL LAMINATE TYPE ELECTRONIC COMPONENT, AND MANUFACTURING DEVICE FOR SERIAL LAMINATE TYPE ELECTRONIC COMPONENT

机译:层叠型电子部件的层叠方向的确定方法,层叠型电子部件的层叠方向的确定装置,串联层叠型电子部件的制造方法以及串联层叠型电子部件的制造装置

摘要

Provided are a method for determining a laminate direction for a laminate type electronic component for accurately determining a laminate direction for a conductor layer in the laminate type electronic component, a laminate direction determination device, a method for manufacturing a serial laminate type electronic component whereby laminate directions for conductor layers in laminate type electronic components are unidirectionally aligned, and a manufacturing device for a serial laminate type electronic component. A laminate direction determination device (3) for a laminate type electronic component includes a measuring means (11, 12) and a determination means (13). The measuring means (11, 12) acquires a measured value associated with an infrared energy amount detected from a monitoring surface for monitoring a laminate type electronic component (200) in which a conductor layer and non-conductor layer are laminated. The determination means (13) sets a threshold according to a measuring condition, compares the threshold and the measured value, and determines on the basis of the comparison results the laminate direction for the conductor layer in the laminate type electronic component (200).
机译:提供一种用于确定用于精确地确定层叠型电子部件中的导体层的层叠方向的层叠型电子部件的层叠方向的方法,层叠方向确定装置,用于制造串联层叠型电子部件的方法。层压型电子部件中的导体层的方向被单向对准,并且提供了一种串行层压型电子部件的制造装置。用于层压型电子部件的层压方向确定装置(3)包括测量装置(11、12)和确定装置(13)。测量装置(11、12)获取与从用于监视层叠有导体层和非导体层的层叠型电子部件(200)的监视面检测到的红外线能量相关的测量值。确定装置(13)根据测量条件设置阈值,将阈值与测量值进行比较,并且基于比较结果来确定层压型电子部件(200)中的导体层的层压方向。

著录项

  • 公开/公告号WO2013005841A1

    专利类型

  • 公开/公告日2013-01-10

    原文格式PDF

  • 申请/专利权人 MURATA MANUFACTURING CO. LTD.;OKAMURA KOKI;

    申请/专利号WO2012JP67366

  • 发明设计人 OKAMURA KOKI;

    申请日2012-07-06

  • 分类号H05K13/08;B65B15/04;H05K13/02;

  • 国家 WO

  • 入库时间 2022-08-21 16:35:34

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