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METHOD FOR DETERMINING LAMINATE DIRECTION FOR LAMINATE TYPE ELECTRONIC COMPONENT, LAMINATE DIRECTION DETERMINATION DEVICE FOR LAMINATE TYPE ELECTRONIC COMPONENT, METHOD FOR MANUFACTURING SERIAL LAMINATE TYPE ELECTRONIC COMPONENT, AND MANUFACTURING DEVICE FOR SERIAL LAMINATE TYPE ELECTRONIC COMPONENT
METHOD FOR DETERMINING LAMINATE DIRECTION FOR LAMINATE TYPE ELECTRONIC COMPONENT, LAMINATE DIRECTION DETERMINATION DEVICE FOR LAMINATE TYPE ELECTRONIC COMPONENT, METHOD FOR MANUFACTURING SERIAL LAMINATE TYPE ELECTRONIC COMPONENT, AND MANUFACTURING DEVICE FOR SERIAL LAMINATE TYPE ELECTRONIC COMPONENT
Provided are a method for determining a laminate direction for a laminate type electronic component for accurately determining a laminate direction for a conductor layer in the laminate type electronic component, a laminate direction determination device, a method for manufacturing a serial laminate type electronic component whereby laminate directions for conductor layers in laminate type electronic components are unidirectionally aligned, and a manufacturing device for a serial laminate type electronic component. A laminate direction determination device (3) for a laminate type electronic component includes a measuring means (11, 12) and a determination means (13). The measuring means (11, 12) acquires a measured value associated with an infrared energy amount detected from a monitoring surface for monitoring a laminate type electronic component (200) in which a conductor layer and non-conductor layer are laminated. The determination means (13) sets a threshold according to a measuring condition, compares the threshold and the measured value, and determines on the basis of the comparison results the laminate direction for the conductor layer in the laminate type electronic component (200).
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