SAMPLE HOLDER, A HT-XRDSYSTEM USING THE SAME, AND A REAL-TIME HT-XRD MEASURING METHOD OF A SELENIZATION AND SULFURIZATION REACTION OF A CIGSS PRECURSOR USING THE HT-XRD SYSTEM

摘要

PURPOSE: A sample holder, a HT-XRD(High Temperature X-Ray Diffraction) system using the same, and a real-time HT-XRD measuring method of a selenization and sulfurization reaction of a CIGSS(Copper Indium Gallium Sulfur-selenide) precursor using the HT-XRD system is provided to efficiently measure X-ray patterns without a noise peak of carbon caused by a graphite dome.;CONSTITUTION: A sample holder comprises a sample supporting stand, a window(32), and domes. The window is formed with a film of an X-ray transmission material. The domes cover the top of the sample supporting stand, thereby forming a closed space. The dome comprises an inner dome(31) and an outer dome(33). The outer dome covers the inner dome. Two cut portions are formed in positions symmetric to the inner and outer domes. The window is arranged in between the cut portions of the inner and outer domes.;COPYRIGHT KIPO 2013