首页> 外国专利> DEFECT INSPECTION DEVICE, PRODUCTION SYSTEM OF OPTICAL DISPLAY DEVICE, MANUFACTURING SYSTEM OF OPTICAL SHEET, AND DEFECT INSPECTION METHOD

DEFECT INSPECTION DEVICE, PRODUCTION SYSTEM OF OPTICAL DISPLAY DEVICE, MANUFACTURING SYSTEM OF OPTICAL SHEET, AND DEFECT INSPECTION METHOD

机译:缺陷检查装置,光学显示装置的生产系统,光学板的制造系统以及缺陷检查方法

摘要

PROBLEM TO BE SOLVED: To provide a defect inspection device, a production system of an optical display device, a manufacturing system of an optical sheet, and a defect inspection method which are capable of dealing with various defects and suppressing increase of the size of a production line.;SOLUTION: A defect inspection device of an optical member includes: a first light source disposed on one side of the optical member; a second light source disposed on one side of the optical member; an imaging apparatus disposed on an optical axis of light emitted from the first light source on the other side of the optical member; and a moving device which moves the second light source between a first position on the optical axis of light emitted from the first light source and a second position deviated from the optical axis.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种能够应对各种缺陷并抑制其尺寸增加的缺陷检查装置,光学显示装置的生产系统,光学片的制造系统以及缺陷检查方法。解决方案:光学构件的缺陷检查装置包括:第一光源,设置在光学构件的一侧;第二光源,设置在光学构件的一侧;成像装置布置在从第一光源发射的光的光轴上在光学构件的另一侧上; COPYRIGHT:(C)2015,JPO&INPIT;在第一光源发出的光的光轴上的第一位置和从第一光源发出的光的第二位置之间移动第二光源。

著录项

  • 公开/公告号JP2014202694A

    专利类型

  • 公开/公告日2014-10-27

    原文格式PDF

  • 申请/专利权人 SUMITOMO CHEMICAL CO LTD;

    申请/专利号JP20130081214

  • 发明设计人 IMURA KEITA;SASAMOTO AYAKO;

    申请日2013-04-09

  • 分类号G01N21/892;G02F1/1335;

  • 国家 JP

  • 入库时间 2022-08-21 16:18:08

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号