首页> 外国专利> SUBSTRATE CONTAMINATION RECOVERY METHOD, SUBSTRATE CONTAMINATION RECOVERY APPARATUS, AND SUBSTRATE CONTAMINATION RECOVERY ANALYSIS SYSTEM

SUBSTRATE CONTAMINATION RECOVERY METHOD, SUBSTRATE CONTAMINATION RECOVERY APPARATUS, AND SUBSTRATE CONTAMINATION RECOVERY ANALYSIS SYSTEM

机译:基板污染恢复方法,基板污染恢复装置以及基板污染恢复分析系统

摘要

PROBLEM TO BE SOLVED: To unfailingly recover only a contamination metal adhering to a peripheral part of a substrate and accurately analyze the contamination metal adhering to the peripheral part of the substrate.;SOLUTION: A liquid is supplied only to a peripheral part of a substrate W1. Droplets contact with the peripheral part of the substrate W1. This process causes a contamination metal adhering to the peripheral part of the substrate W1 to be taken in the droplets. Then, the droplets contacting with the peripheral part of the substrate W1 are cooled to be freezed. This process changes the droplets contacting with the peripheral part of the substrate W1 to an ice block. The ice block taking in the metal contamination is peeled from the substrate W1 to be analyzed by an analyzer.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:可靠地仅回收粘附在基板外围部分的污染金属并准确分析粘附在基板外围部分的污染金属;解决方案:仅向基板的外围部分供应液体W1。液滴与基板W1的外围部分接触。该处理使得附着在基板W1的外围部分上的污染金属被吸收成液滴。然后,与基板W1的外围部分接触的液滴被冷却以冻结。该处理将与基板W1的外围部分接触的液滴改变为冰块。将吸收了金属污染的冰块从基板W1上剥离下来,用分析仪进行分析。版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014017280A

    专利类型

  • 公开/公告日2014-01-30

    原文格式PDF

  • 申请/专利权人 DAINIPPON SCREEN MFG CO LTD;

    申请/专利号JP20120151559

  • 发明设计人 HIRASHITA TOMOMI;

    申请日2012-07-05

  • 分类号H01L21/304;

  • 国家 JP

  • 入库时间 2022-08-21 16:16:51

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