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Method of manufacturing as well as single crystal silicon carbide film-coated substrate of single crystal silicon carbide film-coated substrate and single crystal silicon carbide film

机译:制造方法以及单晶碳化硅膜被覆基板的单晶碳化硅膜被覆基板和单晶碳化硅膜

摘要

PROBLEM TO BE SOLVED: To provide a base material with a single crystal silicon carbide film having a high quality single crystal silicon carbide film which is less susceptible to stresses arising from a lattice mismatch with a silicon substrate or a single crystal silicon film formed on a substrate and has fewer crystal defects than ever, a manufacturing method of a single crystal silicon carbide film which makes it possible to form a high quality single crystal silicon carbide film with reduced crystal detects, and a manufacturing method of the base material with the single crystal silicon carbide film.;SOLUTION: A base material with a single crystal silicon carbide film of the present invention, designated by numeral 1, has a plurality of concaves 3 formed on the surface of a silicon substrate 2. Insulation film 4 containing silicon oxide is formed on the entire surface, including the inside surfaces of these concaves 3, of the silicon substrate 2. The upper ends of side walls of concaves 5 of the insulation film 4 are flattened, constituting a flat plane 6, to which a single crystal silicon carbide film 7 is joined, and the concaves 5 below the single crystal silicon carbide film 7 are left vacant.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种具有高质量的单晶碳化硅膜的单晶碳化硅膜的基材,该单晶碳化硅膜不易受与硅基板或形成在硅衬底上的单晶硅膜的晶格失配所引起的应力的影响。基板且具有比以往更少的晶体缺陷的单晶碳化硅膜的制造方法,该单晶碳化硅膜的制造方法使得可以形成具有减少晶体检测的高质量单晶碳化硅膜,以及具有该单晶的基材的制造方法碳化硅膜。解决方案:本发明的具有单晶碳化硅膜的基材,用数字1表示,在硅基板2的表面上形成有多个凹部3。在硅基板2的包括这些凹部3的内表面在内的整个表面上形成。绝缘膜4的凹部5被弄平,构成平坦的平面6,单晶碳化硅膜7连接到该平面6,并且单晶碳化硅膜7下方的凹部5被空置。 2012,日本特许厅

著录项

  • 公开/公告号JP5585268B2

    专利类型

  • 公开/公告日2014-09-10

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP20100164778

  • 发明设计人 島田 浩行;

    申请日2010-07-22

  • 分类号H01L21/205;C23C16/42;

  • 国家 JP

  • 入库时间 2022-08-21 16:12:50

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